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Description

CDP55ARound Post Tips for Depth Metrology Max W = 55 nm, Max EL = 700 nm DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Round Post Tips for Depth Metrology Max Width = 55 nm Max Effective Length = 700 nm Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 20 Tip Set Back( RNG): 5 15 The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2. 5 times. It is to assist the machine vision

PFQNE-AL probes have less than 3deg of bend

025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 2

Each cantilever comes individually characterized with both spring constant and tip radius accurately measured

Images can be analyzed using Nanoscope Analysis tip estimation feature to estimate the end radius of probes

0 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Au

including Models PSFILM-12M

ICON-PFQNM

and a magnetic moment of 1e-13 EMU (medium)

The Bruker SCM-PtSi probe provides:

2 tube clamps

while the copolymer regions have elastic modulus numbers around 0

-- Seals cell against FFKM boot (EC-V2-CH BOOT) upon engage