Carbon Mount, 25.4mm dia. x 3.2mm pin, Grooved head

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Description

Carbon Mount, 25.4mm dia. x 3.2mm pin, Grooved headDESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard

each identified by its pitch

Rounded Tip 2AB 130mm Carbofib 2 x 0

SynapTek GridStick™ Staining (428KB PDF)

Box size: 76

(pitch is the complete width of one space plus one bar in µm)

Giberson R

PELCO® Tabbed Hole Grids

see the whole series of calibrated probes

I - SDS (111KB PDF)

8cm (2") wafers 2WF 136

Measurements by the NPL in the UK (counterpart of NIST) have demonstrated that the accuracy of the 500µm pitch pattern was ±0

Smaller particles